On Wed, 28 Dec 2005 00:01:58 +0100, Paul Burridge
>On Tue, 27 Dec 2005 15:26:26 -0800, John Larkin
>>Why not measure it?
>Presumably parameter variation. It wouldn't have much relevance to the
>next one in the batch.
Well, that's a problem, but how would a Spice model be any better? In
fact, I'd not trust any Spice model of such a fet operating at such
low current and drain voltage.
If Id were forced somehow, I'd imagine Gm would be pretty consistant
across devices. Gate threshold voltages will be all over the place, of
course... been there, done that, got scars.